Fig. 2
From: A multiplexed magnetic tweezer with precision particle tracking and bi-directional force control

Example diffraction patterns of beads on the bottom surface of the chamber (z = 0 μm) and at the top of the chamber (z = 75 μm)
From: A multiplexed magnetic tweezer with precision particle tracking and bi-directional force control
Example diffraction patterns of beads on the bottom surface of the chamber (z = 0 μm) and at the top of the chamber (z = 75 μm)