Fig. 2
From: Reversible fluorescent solid porous films for detection of zinc ions in biological media
Representative small-angle XRD pattern of films synthesized from TEOS using CTAB surfactant as template, after CTAB removal. The XRD pattern is typical of a long-range ordered hexagonal distribution of pores, with a maximum at 2θ = 2.8 corresponding to a d-spacing of 3.1 nm. The XRD pattern was measured using a Philips PW 1729 diffractometer equipped with glancing-incidence X-ray optics, the incidence angle was 0.5°, and Cu Kα-Ni filtered radiation was used at 30 kV and 40 mA. The synthesis is well-controlled ensuring the same XRD pattern in 10 different films